• - Equipment Name :Transmission Electron Microscope (TEM)

• - Faculty :

• - Department :

• - Lab :

• - Manufacturer : Jeol

• - Model: JEOL JEM-2100F

• Special Features : Field Emission Transmission Electron Microscope EDX analysis Ion slicer for ultrathin specimen preparation

Ultra-high resolution analysis of novel materials at a maximum potential magnification of 0.14 nm.